The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures

Nguyen Thi Minh Hong, Pham Duc Thang, Dang Dinh Long, Pham Thai Ha, Nguyen Ngoc Trung, Pham Hong Cong, Nguyen Dinh Duc
Author affiliations

Authors

  • Nguyen Thi Minh Hong Laboratory for Micro and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Pham Duc Thang Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Dang Dinh Long Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Pham Thai Ha Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Nguyen Ngoc Trung Faculty of Engineering Physics and Nanotechnology, University of Engineering and Technology, Vietnam National University, Hanoi
  • Pham Hong Cong Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi
  • Nguyen Dinh Duc Faculty of Engineering Mechanics and Automation, University of Engineering and Technology, Vietnam National University, Hanoi

DOI:

https://doi.org/10.15625/0868-3166/24/3S1/5222

Keywords:

magnetoelectric effect, multiferroic materials, magnetic reorientation

Abstract

We have investigated the effects of temperature on the magnetic easy axis reorientation (EARs) in polycrystalline ferromagnetic (FM) nano-scale thin films, i.e. (001)-oriented cubic films such as Fe, Ni, CFO and (0001)-oriented hexagonal films such as Co, grown on ferroelectric (FE) substrates, for example PZT, BTO substrates. The model of FM/FE bilayered heterostructures has been applied to study the total free energy of the FM films. By minimizing this energy, we have shown that temperature has a significant effect on a critical electric field induced magnetic reorientation.

Downloads

Download data is not yet available.

Downloads

Published

07-11-2014

How to Cite

[1]
N. T. M. Hong, “The Temperature-sensitivity of a Critical Electric Field Induced Magnetic Easy-axis Reorientation Ferromagnetic/ferroelectric Layered Heterostructures”, Comm. Phys., vol. 24, no. 3S1, pp. 71–79, Nov. 2014.

Issue

Vol. 24 No. 3S1 (2014)

Section

Papers

License

Communications in Physics is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

Copyright on any research article published in Communications in Physics is retained by the respective author(s), without restrictions. Authors grant VAST Journals System (VJS) a license to publish the article and identify itself as the original publisher. Upon author(s) by giving permission to Communications in Physics either via Communications in Physics portal or other channel to publish their research work in Communications in Physics agrees to all the terms and conditions of https://creativecommons.org/licenses/by-sa/4.0/ License and terms & condition set by VJS.

Similar Articles

<< < 15 16 17 18 19 20 21 22 23 24 > >> 

You may also start an advanced similarity search for this article.